FLAIR 2007  -  Field Laser Applications in Industry and Research, September 2-7, 2007, Florence, Italy

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Review : Industry Session at TDLS 2005 Florence

Industrial Analytical Systems based on Tunable Diode-Lasers

Session Chair  :  Peter W. Werle  National Institute of Applied Optics  50125 Florence, Italy E-Mail :  PWWerle@ino.it Homepage : http://www.ino.it/~pwwerle/

 

Here you find some impressions from the Industry Exhibition : 1 2 3 4 5 6

for more photos from the Industry Session click on speakers below ...

09:00	Opening remarks	Peter Werle
	Laser Devices
09:15	Laser Components GmbH	Johannes Kunsch	Quo vadis TDLS ?
09:30	Vertilas GmbH	Markus Ortsiefer	VCSELs in the 1.3-2.0 µm wavelength range for TDLS applications
09:45	Nanoplus GmbH	Johannes Koeth	DFB laser diodes for tunable diode laser spectroscopy at wavelengths beyond 2.3 µm
10:00	Alpes Lasers SA	Stéphane Blaser	Quantum cascade lasers for TDLS
10:15	Aculight Corporation	Angus Henderson	Room temperature cw PPLN optical parametric oscillator  for mid-infrared spectroscopy
10:30	Coffee Break
	Components & Modules
11:00	Toptica Photonics AG	Jan Posthumus	Distributed feedback diode lasers and tunable femtosecond fiber lasers for spectroscopy
11:15	Sacher Lasertechnik Group	Sandra Stry	High power Littman external cavity systems
11:30	Vescent Photonics	Mike Anderson	Electronically tunable, waveguide external-cavity semiconductor lasers
11:45	Laser Components GmbH	Lars Mechold	Lasers and laser source modules for TDLS
12:00	Scienza Industria Tecnologia	Antonio Chiarugi	Electronics and signal processing components for TDLS
12:15	Lunch Break
	Medicine & Environment
14:00	Cascade Technologies Ltd.	Mike McCulloch	QC Laser gas sensor platform: from high end to low cost volume applications
14:15	Ekips Technologies Inc.	Pat McCann	Lasers and laser systems for medical diagnostics
14:30	Los Gatos Research Inc.	Doug Baer	Novel instrumentation for trace gas measurements in the field
14:45	Aerodyne Research Inc.	David Nelson	High Sensitivity QCL trace gas monitors for environmental and industrial monitoring
15:00	Coffee Break
	Process Industry
16:00	Unisearch Associates Inc.	Alak Chanda	LasIR - the next generation
16:15	Norsk Electro Optikk AS	Peter Kaspersen	A new generation  TDL analysers from NEO for process applications
16:30	Siemens AG	Michael Markus	The state-of-the-art of diode-laser based gas analysis in process industries
16:45	Closing remarks	Peter Werle
18:15	Bus departure Demidoff  Hotel
20:00	Conference Dinner Castello Mediceo di CAFAGGIOLO

 Download  Abstracts here

contact :  Peter W. Werle,  National Institute of Applied Optics,  50125 Florence, Italy.
E-Mail   :  PWWerle@inoa.it   Homepage :  http://www.ino.it/home/pwwerle